Titanium contacts on N-type silicon
PhD thesis
Wilkinson, J. 1974. Titanium contacts on N-type silicon. PhD thesis Middlesex Polytechnic
| Type | PhD thesis |
|---|---|
| Title | Titanium contacts on N-type silicon |
| Authors | Wilkinson, J. |
| Abstract | The current transport mechanism usually assumed to be valid for metal silicon Schottky barriers is thermionic-emission. However, Crowell and Beguwala, using a thermionic-diffusion model, suggested that significant deviations from the behaviour predicted by the thermionic-emission theory shonld be observed on low barriers, especially those formed on silicon of low impurity concentration. The barrier height of titanium on n-type silicon is 0.1)0 volt which is lower than most other metals, and should make the effects predicted |
| Department name | Microelectronics Centre |
| Institution name | Middlesex Polytechnic |
| Publication dates | |
| 13 Jan 2015 | |
| Publication process dates | |
| Deposited | 13 Jan 2015 |
| Completed | Dec 1974 |
| Output status | Published |
| Language | English |
| File |
https://repository.mdx.ac.uk/item/84w02
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