Output sampling for output diversity in automatic unit test generation

Article


Menéndez, H., Boreale, M., Gorla, D. and Clark, D. 2020. Output sampling for output diversity in automatic unit test generation. IEEE Transactions on Software Engineering. https://doi.org/10.1109/TSE.2020.2987377
TypeArticle
TitleOutput sampling for output diversity in automatic unit test generation
AuthorsMenéndez, H., Boreale, M., Gorla, D. and Clark, D.
Abstract

Diverse test sets are able to expose bugs that test sets generated with structural coverage techniques cannot discover. Input-diverse test set generators have been shown to be effective for this, but also have limitations: e.g., they need to be complemented with semantic information derived from the Software Under Test. We demonstrate how to drive the test set generation process with semantic information in the form of output diversity. We present the first totally automatic output sampling for output diversity unit test set generation tool, called OutGen. OutGen transforms a program into an SMT formula in bit-vector arithmetic. It then applies universal hashing in order to generate an output-based diverse set of inputs. The result offers significant diversity improvements when measured as a high output uniqueness count. It achieves this by ensuring that the test set’s output probability distribution is uniform, i.e. highly diverse. The use of output sampling, as opposed to any of input sampling, CBMC, CAVM, behaviour diversity or random testing improves mutation score and bug detection by up to 4150% and 963% respectively on programs drawn from three different corpora: the R-project, SIR and CodeFlaws. OutGen test sets achieve an average mutation score of up to 92%, and 70% of the test sets detect the defect. Moreover, OutGen is the only automatic unit test generation tool that is able to detect bugs on the real number C functions from the R-project.

PublisherInstitute of Electrical and Electronics Engineers
JournalIEEE Transactions on Software Engineering
ISSN0098-5589
Electronic1939-3520
Publication dates
Online15 Apr 2020
Publication process dates
Deposited13 Apr 2021
Accepted19 Apr 2020
Accepted author manuscript
File Access Level
Open
Copyright Statement

© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Digital Object Identifier (DOI)https://doi.org/10.1109/TSE.2020.2987377
LanguageEnglish
Permalink -

https://repository.mdx.ac.uk/item/894z7

Download files


Accepted author manuscript
outgen-main.pdf
File access level: Open

  • 13
    total views
  • 3
    total downloads
  • 0
    views this month
  • 0
    downloads this month

Export as