An improved model-based method to test circuit faults
Article
Cheng, X., Ouyang, D., Yunfei, J. and Zhang, C. 2005. An improved model-based method to test circuit faults. Theoretical Computer Science. 341 (1-3), pp. 150-161. https://doi.org/10.1016/j.tcs.2005.04.004
Type | Article |
---|---|
Title | An improved model-based method to test circuit faults |
Authors | Cheng, X., Ouyang, D., Yunfei, J. and Zhang, C. |
Abstract | This paper presents an improved model-based reasoning method to test circuit faults. The proposed automated testing procedure is applicable even when the target system contains multiple faulty modes. Based on the proposed method, the observation can be organised to guarantee correct solutions are included in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of the proposed method. The relationship between the testing procedure and the corresponding prime implication is formally analyzed for algorithmic implementation. The work is being extended, funded by the Chinese National Natural Science Foundation, in collaboration with Jilin University, China. |
Keywords | testing; search; deduction; abduction; prime implication |
Research Group | Artificial Intelligence group |
Publisher | Elsevier |
Journal | Theoretical Computer Science |
ISSN | 0304-3975 |
Electronic | 1879-2294 |
Publication dates | |
Online | 17 May 2005 |
05 Sep 2005 | |
Publication process dates | |
Deposited | 14 Oct 2008 |
Accepted | 04 Apr 2005 |
Output status | Published |
Digital Object Identifier (DOI) | https://doi.org/10.1016/j.tcs.2005.04.004 |
Web of Science identifier | WOS:000231660900008 |
Language | English |
https://repository.mdx.ac.uk/item/80v04
40
total views0
total downloads1
views this month0
downloads this month